Scatterometry

with

Collimated Illumination

Our patented technology enables us to inspect the quality of periodic gratings used in photonics and quantum technologies. We determine changes

of geometrical parameters during the fabrication in a contact-free and non-destructive method.

High-resolution

Terahertz

Near-field Microscopy 

Our unique instrument allows the investigation of the transient photo-conductivity and the carrier life-time of photo-excited semiconductors, providing a vast amount of data that is ideal for semiconductor characterization and quality inspection.

 Consultancy

and

Measurement Services 

Our state-of-the art laboratories and equipment allows us to implement various experiments over a wide spectral range of the electromagnetic radiations, necessary for in-depth characterization of different materials and structure. Explore the possibilities and specifications of our techniques.